Olympus PlanC N 60X Microscope Objective (PLCN60X, NA 0.80, Infinity) INDUSTRIAL INFINITY CORRECTED Semiconductor and electronics inspection

Semiconductor and electronics inspection

and thicker sample holders without direct immersion

or MX series systems requiring premium APO-corrected 100W mercury illumination

The inverted metallograph configuration — where the objective is below the stage and the specimen rests on top — is ideal for large

Olympus PlanC N 60X Microscope Objective (PLCN60X, NA 0.80, Infinity) INDUSTRIAL INFINITY CORRECTED Semiconductor and electronics inspectionHigh magnification 60 plan achromatic objective for reliable routine microscopy. 60 Magnification, NA 0. 80 Strong resolution for detailed observation. Plan Achromatic Optics Flat field correction and reduced chromatic aberration across the field. Air (Dry) Objective Operates without immersion media for brightfield and routine imaging. Working Distance ~0. 2 mm Suitable for close focus high magnification use. RMS Thread Compatibility Standard